A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility
Huotari, Simo (University of Helsinki)
Sahle, Christoph J. (ESRF - the European Synchrotron)
Henriquet, C. (ESRF - the European Synchrotron)
Al-Zein, Ali (Beirut Arab University)
Martel, Keith (ESRF - the European Synchrotron)
Simonelli, Laura (ALBA Laboratori de Llum de Sincrotró)
Verbeni, Roberto (ESRF - the European Synchrotron)
Gonzalez, Hervé (ESRF - the European Synchrotron)
Lagier, Marie Claire (ESRF - the European Synchrotron)
Ponchut, Cyril (ESRF - the European Synchrotron)
Moretti Sala, M. (ESRF - the European Synchrotron)
Krisch, M. (ESRF - the European Synchrotron)
Monaco, Giulio (Università di Trento)
Date: |
2017 |
Abstract: |
An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions. |
Rights: |
Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original. |
Language: |
Anglès |
Document: |
Article ; recerca ; Versió publicada |
Subject: |
Inelastic x-ray scattering ;
X-ray Raman spectroscopy ;
Beamline ;
Spectrometer ;
ESRF |
Published in: |
Journal of Synchrotron Radiation, Vol. 24, Part 2 (March 2017) , p. 521-530, ISSN 1600-5775 |
DOI: 10.1107/S1600577516020579
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Record created 2019-02-19, last modified 2022-02-06